Delays in the Generation of Test Patterns and in the Selection of Critical Paths

Abstract

Because it constantly increases the sensitivity to the statistical delay of a path, a test pattern has typically been considered a random variable with a Gaussian distribution. In various circuit configurations, the pattern-created delay is non-Gaussian, and its sensitivity varies between test patterns. Probability mass functions are used to express it (PMFs). By employing many uncorrelated test patterns per path, this article explains how autonomous test pattern generation (ATPG) can increase defect coverage (DC). The ATPG method's impact is evaluated by comparing it to previous methods. It has been shown that critical pathways can be identified for further exploration using the ATPG supplied.